Stacked-type semiconductor device package

ABSTRACT

A stacked-type semiconductor device package is provided. The stacked-type semiconductor device package includes a plurality of stacked semiconductor chip packages with joining electrodes exposed on sides of the semiconductor chip packages and a flexible printed circuit board (flexible PCB) on which the stacked semiconductor chip packages are mounted. The flexible PCB includes a first surface having connecting electrodes corresponding to the joining electrodes of the stacked semiconductor chip packages and a second surface opposite the first surface. The flexible PCB covers the sides of the stacked semiconductor chip packages, and the connecting electrodes of the first surface are connected to the joining electrodes of the stacked semiconductor chip packages.

CROSS-REFERENCE TO RELATED APPLICATIONS

This application is a Continuation of U.S. patent application Ser. No.11/961,747, filed on Dec. 20, 2007, now pending, which claims priorityunder 35 U.S.C. §119 from Korean Patent Application No. 10-2006-131082filed on Dec. 20, 2006, in the Korean Intellectual Property Office, theentire contents of which are hereby incorporated by reference

BACKGROUND

1. Technical Field

The present invention relates to semiconductor device packages and, moreparticularly, to a stacked-type semiconductor device package.

2. Description of the Related Art

In the semiconductor industry, packaging technologies for integratedcircuits (ICs) have been advancing to meet requirements forminiaturization and mounting reliability. For example, the requirementfor miniaturization results in acceleration of technological developmentfor a package having a similar size in relation to a semiconductor chip.Further, the requirement for mounting reliability places importance onpackaging technologies that are capable of enhancing efficiency of amounting process and improving mechanical and electrical reliabilityafter the mounting process is completed.

Including requirements for multi-functionalization as well asminiaturization of electric and electronic appliances, varioustechnologies have been studied and developed to provide high-capacitysemiconductor products. Methods for providing the high-capacitysemiconductor products include increasing the capacity of a memory chip,i.e., increased integration of the memory chip. The increasedintegration of the memory chip may be achieved by integrating more cellsinto a limited space of the semiconductor chip.

However, the increased integration of the memory chip requireshigh-level technology such as precise ultra-small linewidth processes aswell as significant development time. Accordingly, stacking technologieshave been proposed as alternative methods for providing high-capacitysemiconductor products.

In recent years, demands for system-in-package (SIP) and multi-chippackage (MCP) technologies have been rapidly increasing for applicationsin mobile appliances. The SIP is a special form of the MCP wheredifferent semiconductor devices (e.g., DRAM, SRAM, CPU, etc.) areintegrated into one package. In the SIP and the MCP, even when only onesemiconductor device is defective, the package is treated as a badpackage although the other semiconductor devices in the package are notdefective. Therefore, it is difficult to improve production yield ofthese types of packages.

In order to overcome these problems, a package on package (POP) or apackage in package (PIP) technology has been used. In the POP and PIPtechnologies, after semiconductor chips are assembled into asemiconductor chip package, good semiconductor chip packages areselected by means of a test process so that they can be manufacturedinto one package. However, a conventional POP needs solder ballsprovided on a bottom surface of respective semiconductor chip packagesto stack and electrically connect the semiconductor chip packages. Thesolder balls lead to an increase in thickness of the packagemanufactured by means of a PIP method. Moreover, since a space is neededbetween the semiconductor chip packages, a thickness of the packageincreases with an increase in the number of stacked semiconductor chippackages.

In addition, a process becomes complex when semiconductor chip packageshaving different structures or sizes are stacked by means of a POPmethod using solder balls. The present invention addresses these andother disadvantages of the conventional art.

SUMMARY

Exemplary embodiments of the present invention are directed to astacked-type semiconductor device package. In an exemplary embodiment,the stacked-type semiconductor device package may include: a pluralityof stacked semiconductor chip packages with joining electrodes exposedon sides of the semiconductor chip packages; and a flexible printedcircuit board (flexible PCB) on which the stacked semiconductor chippackages are mounted, the flexible PCB including a first surface havingconnecting electrodes corresponding to the joining electrodes of thestacked semiconductor chip packages and a second surface opposite thefirst surface, wherein the flexible PCB covers the sides of the stackedsemiconductor chip packages and the connecting electrodes of the firstsurface are connected to the joining electrodes of the stackedsemiconductor chip packages.

BRIEF DESCRIPTION OF THE DRAWINGS

FIG. 1A is a top plan view illustrating a semiconductor chip packageaccording to an embodiment of the present invention.

FIG. 1B is a cross-sectional view taken along the line I-I′ of FIG. 1A.

FIG. 2A is a top plan view illustrating a semiconductor chip packageaccording to another embodiment of the present invention.

FIG. 2B is a cross-sectional view taken along the line II-II′ of FIG.2A.

FIG. 3A is a top plan view illustrating a semiconductor chip packageaccording to still another embodiment of the present invention.

FIG. 3B is a cross-sectional view taken along the line III-III′ of FIG.3A.

FIGS. 4A through 4C are cross-sectional views illustrating astacked-type semiconductor device package according to an embodiment ofthe present invention.

DETAILED DESCRIPTION

The present invention will now be described more fully hereinafter withreference to the accompanying drawings, in which preferred embodimentsof the invention are shown.

FIG. 1A is a top plan view illustrating a semiconductor chip packageaccording to an embodiment of the present invention, and FIG. 1B is across-sectional view taken along the line I-I′ of FIG. 1A.

Referring to FIGS. 1A and 1B, a semiconductor chip package 100 mayinclude a semiconductor chip 110, a printed circuit board (PCB) 120, anda molding material 130.

The semiconductor chip 110 may include bonding pads 112 and sector-formmolding electrodes 114 disposed so as to cover the bonding pads 112,respectively. The bonding pads 112 and the molding electrodes 114 areprovided on an active surface of the semiconductor chip 110. The moldingelectrodes 114 may be formed by separating a semiconductor wafer intosemiconductor chips 110 after forming a conductive molding material,such as copper (Cu) or gold (Au), so as to cover adjacent bonding padsbetween bonding pads of adjacent semiconductor chips on thesemiconductor wafer. Thus, the molding electrodes 114 may exhibit asector form having one side surface aligned with the edge of thesemiconductor chip 110 while covering the respective bonding pads 112.

The PCB 120 may include a core material 122 functioning as a body, anupper insulating layer 124 u, and a lower insulating layer 124Λ. The PCB120 may have one selected from the group consisting of a substrate type,a tape type, and a film type. To decrease thickness of the semiconductorchip package 100, the PCB 120 may have a tape type or a film type. Theupper insulating layer 124 u and the lower insulating layer 124Λ may bepolyimide or photo solder resist (PSR). The upper insulating layer 124 uand the lower insulating layer 124Λ may be a first surface and a secondsurface of the PCB 120, respectively. The semiconductor chip 110 may bemounted on the first surface of the PCB 120 using an adhesive material125.

The molding material 130 may seal the semiconductor chip 110 and themolding electrodes 114. The molding material 130 may be epoxy moldingcompound (EMC). Thus, the semiconductor chip 110 may have the same sizeas the PCB 120 and have one side surface of each of the moldingelectrodes 114 exposed in an edge direction of the semiconductor chip110. As a result, the semiconductor chip package 100 may include joiningelectrodes formed by the molding electrodes 114 exposed on the sidesurface. The joining electrodes may directly be connected to another PCBor an external circuit such as a system board. Alternatively, thejoining electrodes may indirectly be connected to another PCB or anexternal circuit such as a system board using a connecting means. Thejoining electrodes may be used to test the semiconductor chip package100.

FIG. 2A is a top plan view illustrating a semiconductor chip packageaccording to another embodiment of the present invention, and FIG. 2B isa cross-sectional view taken along the line II-II′ of FIG. 2A.

Referring to FIGS. 2A and 2B, a semiconductor chip package 200 mayinclude a semiconductor chip 210, a printed circuit board (PCB) 220, anda molding material 230.

The semiconductor chip 210 may include bonding pads (not shown) disposedat an active surface of the semiconductor chip 210. The PCB 220 mayinclude a core material 222 functioning as a body, an upper insulatinglayer 224 u, and a lower insulating layer 224Λ. The PCB 220 may have aconcave internal mounting space. The PCB 220 may have one selected fromthe group consisting of a substrate type, a tape type, and a film type.To decrease thickness of the semiconductor chip package 200, the PCB 220may have a tape type or a film type. The upper insulating layer 224 uand the lower insulating layer 224Λ may be polyimide or photo solderresist (PSR). The upper insulating layer 224 u and the lower insulatinglayer 224Λ may be a first surface and a second surface of the PCB 220,respectively.

The semiconductor chip 210 may be mounted on the first surface of thePCB 220 corresponding to a lower surface of the concave internalmounting space using adhesive means 225. The adhesive means 225 may be acombination of joining lands provided at the bonding pads of thesemiconductor chip 210 and the first surface of the PCB 220,respectively. Exposed joining electrodes 226 s may be provided at thesecond surface of the PCB 220 facing away from the concave internalmounting space. The joining electrodes 226 s may be connected to aninternal wiring (not shown) of the PCB 220. As a result, thesemiconductor chip package 200 may include the joining electrodes 226 sexposed on the side surface. The joining electrodes 226 s may directlybe connected to another PCB or an external circuit such as a systemboard. Alternatively, the joining electrodes 226 s may indirectly beconnected to another PCB or an external circuit such as a system boardusing a connecting means. The joining electrodes 226 s may be used totest the semiconductor chip package 200.

The molding material 230 may seal the semiconductor chip 210 and thefirst surface of the PCB 220. The molding material 230 may be epoxymolding compound (EMC). Test lands 226Λ provided at the second surfaceof the PCB 220 facing away from the lower surface of the concaveinternal mounting space may be connected to the internal wiring of thePCB 220 so as to be used to test the semiconductor chip package 200. Thetest lands 226Λ may be provided to test the semiconductor chip package200 using a typical test apparatus including a pogo pin.

FIG. 3A is a top plan view illustrating a semiconductor chip packageaccording to still another embodiment of the present invention, and FIG.3B is a cross-sectional view taken along the line III-III′ of FIG. 3A.

Referring to FIGS. 3A and 3B, a semiconductor chip package 300 mayinclude a semiconductor chip 310, a printed circuit board (PCB) 320,bonding wires 327, and a molding material 330.

The semiconductor chip 310 may include bonding pads 312 disposed at anactive surface of the semiconductor chip 310. The PCB 320 may include acore material 322 functioning as a body, an upper insulating layer 324u, and a lower insulating layer 324Λ. The PCB 320 may have a concaveinternal mounting space. The PCB 320 may have one selected from thegroup consisting of a substrate type, a tape type, and a film type. Todecrease thickness of the semiconductor chip package 300, the PCB 320may have a tape type or a film type. The upper insulating layer 324 uand the lower insulating layer 324Λ may be polyimide or photo solderresist (PSR). The upper insulating layer 324 u and the lower insulatinglayer 324Λ may be a first surface and a second surface of the PCB 320,respectively. The PCB 320 may include bonding electrodes 326 u providedat the first surface and each corresponding to respective bonding pads312.

The semiconductor chip 310 may be mounted on the first surface of thePCB 320 corresponding to a lower surface of the concave internalmounting space using an adhesive material 325. Exposed joiningelectrodes 326 s may be provided at the second surface of the PCB 320facing away from the concave internal mounting space. The joiningelectrodes 326 s may be connected to an internal wiring (not shown) ofthe PCB 320. As a result, the semiconductor chip package 300 may includethe joining electrodes 326 s exposed on the side surface. The joiningelectrodes 326 s may directly be connected to another PCB or an externalcircuit such as a system board. Alternatively, the joining electrodes326 s may indirectly be connected to another PCB or an external circuitsuch as a system board using a connecting means. The joining electrodes326 s may be used to test the semiconductor chip package 300.

Bonding wires 327 may electrically connect the bonding pads 312 tocorresponding bonding electrodes 326 u. The molding material 330 mayseal the semiconductor chip 310, the bonding wires 327, and the firstsurface of the PCB 320. The molding material 330 may be epoxy moldingcompound (EMC). Test lands 326Λ provided at the second surface of thePCB 320 facing away from the lower surface of the concave internalmounting space may be connected to internal wiring (not shown) of thePCB 320 so as to be used to test the semiconductor chip package 300. Thetest lands 326Λ may be provided to test the semiconductor chip package300 using a typical test apparatus including a pogo pin.

Since each of the semiconductor chip packages according to the foregoingembodiments is configured to include joining electrodes exposed on aside surface, unlike the conventional art, it is not necessary toprovide solder balls for stacking the semiconductor chip packages. Thus,a stacked semiconductor chip package may have decreased thickness.

FIGS. 4A through 4C are cross-sectional views illustrating astacked-type semiconductor device package according to an embodiment ofthe present invention. The stacked-type semiconductor device package mayinclude stacked semiconductor chip packages 100, 200, and 300, aflexible printed circuit board (flexible PCB) 420, and a moldingmaterial 430.

Inter-package adhesive materials 425 b and 425 c may be provided betweenthe semiconductor chip packages 100 and 200, and the semiconductor chippackages 200 and 300, respectively. The inter-package adhesive materialsmay be used to adhere the semiconductor chip packages 100 and 200 toeach other, and adhere the semiconductor chip packages 200 and 300 toeach other, respectively. The stacked semiconductor chip packages 100,200, and 300 may be mounted on a first surface of the flexible PCB 420,where an upper insulating layer 424 u is provided, using an adhesivematerial 425 a. The stacked semiconductor chip packages 100, 200, and300 may have the same structure and size or different structures andsizes.

The flexible PCB 420 may include a flexible core material 422functioning as a body, the upper insulating layer 424 u, and a lowerinsulating layer 424Λ. The upper insulating layer 424 u may includeconnecting electrodes 426 us corresponding to joining electrodes 114,226 s, and 326 s exposed on side surfaces of the stacked semiconductorchip packages 100, 200, and 300, respectively. The core material 422 maybe polyimide including an internal wiring (not shown). The upperinsulating layer 424 u and the lower insulating layer 424Λ may bepolyimide or photo solder resist (PSR). In the case where the upperinsulating layer 424 u and the lower insulating layer 424Λ arepolyimide, the flexible PCB 420 may have a tape type or a film type. Theupper insulating layer 424 u and the lower insulating layer 424Λ may bea first surface and a second surface of the flexible PCB 420,respectively.

Because the flexible PCB 420 has excellent flexibility, the flexible PCB420 may cover sides of the stacked semiconductor chip packages 100, 200,and 300. If the flexible PCB 420 has a sufficient length, it may coveran upper portion of the stacked semiconductor chip packages 100, 200,and 300. Thus, the connecting electrodes 426 us on the first surface ofthe PCB 420 may be connected to the joining electrodes 114, 226 s, and326 s of the stacked semiconductor chip packages 100, 200, and 300.Referring to a reference numeral “A” of FIG. 4A and FIG. 4B, theconnecting electrodes 426 us may further include pre-solders 426 psprovided on their surfaces to enhance mechanical and electricalreliability between the joining electrodes 114, 226 s, and 236 s and theconnecting electrodes 426 us. Each of the pre-solders 426 ps may includetin-silver alloy (Sn—Ag alloy).

Unlike what is shown in FIG. 4C, even if the semiconductor chip packages100, 200, and 300 having different structures and sizes are stacked, theflexible PCB 420 may cover not only sides but also the upper portion ofthe stacked semiconductor chip packages 100, 200, and 300.

The molding material 430 may seal the stacked semiconductor chippackages 100, 200, and 300, the joining electrodes 114, 226 s, and 326s, and the first surface of the flexible PCB 420. The molding material430 may include epoxy molding compound (EMC). Solder balls 426 sbprovided on the second surface of the flexible PCB 430 are connected toan internal wiring of the flexible PCB 430 to be connected to anexternal circuit such as a system board.

Although the present embodiment has been described as including one ofeach stacked semiconductor chip package 100, 200, and 300, one ofordinary skill in the art would appreciate that other combinations ofstacked semiconductor chip packages are included within the spirit andscope of the invention. For instance, the stacked-type semiconductordevice package may have two or more stacked semiconductor chip packages100 and one stacked semiconductor chip package 200, or any othercombination of the stacked semiconductor chip packages 100, 200, and300.

According to the foregoing stacked-type semiconductor device package,after respective semiconductor chip packages are tested, only goodsemiconductor chip packages are stacked. Therefore, production yield mayincrease, unlike a conventional semiconductor device package where aplurality of semiconductor devices (or chips) are assembled in onepackage. As a result, the cost for a manufacturing process may bereduced.

The stacked-type semiconductor device package is configured such thatjoining electrodes exposed on sides of stacked semiconductor chippackages and connecting electrodes of a flexible PCB are connected usingthe flexibility of the flexible PCB. Therefore, the thickness of thestacked semiconductor chip packages is not increased due to solder ballsthat are used to stack conventional semiconductor chip packages. As aresult, a stacked-type semiconductor device package with increasedmounting density may be achieved.

Due to the above configuration of the stacked-type semiconductor devicepackage, semiconductor chip packages having different structures andsizes may be stacked so as to have various structures. As a result, astacked-type semiconductor device package is provided to readily packagevarious semiconductor chip packages.

Although the present invention has been described in connection with theembodiment of the present invention illustrated in the accompanyingdrawings, it is not limited thereto. It will be apparent to thoseskilled in the art that various substitutions, modifications and changesmay be made without departing from the scope and spirit of theinvention.

1. A stacked-type semiconductor device package, comprising: a pluralityof stacked semiconductor chip packages with joining electrodes exposedon sides of the semiconductor chip packages; and a flexible printedcircuit board (PCB) on which the stacked semiconductor chip packages aremounted, the flexible PCB including a first surface having connectingelectrodes corresponding to the joining electrodes of the stackedsemiconductor chip packages and a second surface opposite the firstsurface, wherein the flexible PCB covers the sides of the stackedsemiconductor chip packages, and the connecting electrodes of the firstsurface are connected to the joining electrodes of the stackedsemiconductor chip packages.
 2. The stacked-type semiconductor devicepackage of claim 1, wherein the stacked semiconductor chip packages havethe same structure and size.
 3. The stacked-type semiconductor devicepackage of claim 1, wherein the stacked semiconductor chip packages havedifferent structures and sizes with respect to each other.
 4. Thestacked-type semiconductor device package of claim 1, wherein theflexible PCB has a tape type or a film type.
 5. The stacked-typesemiconductor device package of claim 1, further comprising: a moldingmaterial configured to seal the stacked semiconductor chip packages, thejoining electrodes, and the first surface of the flexible PCB.
 6. Thestacked-type semiconductor device package of claim 5, wherein themolding material includes epoxy molding compound.
 7. The stacked-typesemiconductor device package of claim 1, further comprising: solderballs disposed on the second surface of the flexible PCB.
 8. Thestacked-type semiconductor device package of claim 1, further comprisingpre-solders disposed on the connecting electrodes.
 9. The stacked-typesemiconductor device package of claim 1, wherein the flexible PCB coversat least a portion of a top surface of at least one of the stackedsemiconductor chip packages.
 10. The stacked-type semiconductor devicepackage of claim 1, further comprising: a first adhesive materialadhering a first one of the stacked semiconductor chip packages to thefirst surface of the flexible PCB; and a second adhesive materialadhering the plurality of stacked semiconductor chip packages to eachother.